However, the absolute resolution does not yet reach the theoretical limit of 2nm, which is due to space charge limitation. With an optimized system setting, a lateral resolution of 18nm could be achieved, which is up to now the best value reported for energy filtered XPEEM imaging. The lateral resolution is improved by a factor of four, compared to a non-corrected system, whereas the transmission is enhanced by a factor of 5 at a moderate resolution of 80nm. The positive effect of double aberration correction in x-ray induced Photoelectron Emission Microscopy (XPEEM) has been successfully demonstrated for both, the lateral resolution and the transmission, using the Au 4f XPS peak for element specific imaging at a kinetic energy of 113eV. Recent developments in increased energy resolution will offer great benefit for Predictions on the strong localisation of phonon excitations as opposed toĮlectronic excitations and show that a combination of atomic resolution and These experiments confirm recent theoretical Careful data analysisĪllows us to get a glimpse of what are likely phonon excitations with both anĮnergy loss and gain part. Modulation of the broadening of the zero loss peak. Is indeed available at very low energy losses around 100 meV expressed as a In this paper we demonstrate experimentally that atomic resolution information Scientists question the value of combined high spatial and energy resolutionįor mapping interband transitions and possibly phonon excitation in crystals. Known to be delocalised due to the long range interaction of the chargedĪccelerated electrons with the electrons in a sample. in situ experiments.Ītomically resolved electron energy-loss spectroscopy experiments areĬommonplace in modern aberrationcorrected transmission electron microscopes.Įnergy resolution has also been increasing steadily with the continuous in situ studies of interfacial effects, followed by comments on how to achieve and maintain highest possible resolution & sensitivity when keeping the effect of electron beam under control during these atomic-scale. unique properties directly on its characteristic length scale.Progress in recent research is briefly reviewed to highlight the potential when using latest S/TEM methodology optimized for atomic scale investigations and how this can be extended to. Focus behind these developments is the research on nanomaterial-based technologies.Current trends in S/TEM research focus on extending atomic scale characterization capabilities from static to dynamic studies to understand in more detail the link between structure and its evolution vs. High resolution imaging methods reveals atomic structure while spectroscopy gives additional access to elemental distribution and chemical bonding. Characterization methods utilizing Scanning / Transmission Electron Microscopes have become routine techniques to investigate interface structures in nanomaterials.
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